If for some reason the midpoint of a detector pixel is not representative for the average scattering intensity of the entire pixel it is possible to resort to Monte-Carlo integration.
To request Monte-Carlo integration over detector pixels, use
simulation.options().setMonteCarloIntegration(True, n)
where n
is the number of scattering intensity evaluations per pixel.
This example demonstrates that for large particles (~$1000$ nm) the contribution to the scattered intensity from the form factor oscillates rapidly within one detector bin and analytical calculations (performed for the bin center) give completely a wrong intensity pattern. In this case Monte-Carlo integrations over detector bin should be used.
The simulation generates four plots using different sizes of the particles, (radius $=10$ nm, height $=20$ nm) or (radius $=1$ $\mu$m, height $=2$ $\mu$m), and different calculation methods: analytical calculations or Monte-Carlo integration. The other parameters are identical:
|
|